ZEISS METROTOM 6 scout (GOM CT)

When digitizing a part, ZEISS METROTOM 6 scout (GOM CT) achieves an outstanding sharpness of detail: On the one hand, because it uses a high-resolution 3k X-ray detector for acquiring measuring data and on the other hand, because each part is measured in the best possible measurement position and thus always in the highest possible resolution. You can see the result below: on the left, measuring data generated with ZEISS METROTOM 6 scout (GOM CT) and on the right the usual standard.

GOM Volume Inspect allows complete CT data analysis in 3D to evaluate the part quality and optimize your manufacturing process. Individual sectional images allow you to view the volume layer by layer, making even the smallest details and defects visible. The detected defects can be analyzed in detail and automatically evaluated according to various criteria. In addition, you can load volume data of several components into a project, perform a trend analysis and compare the analysis with CAD data. All measurement results are documented and finally combined in a well-structured report. Intuitive operation and high performance: CT data analysis has never been easier!